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Journal of the American Chemical Society

Volumn 134, Issue 26, 2012, Pages 10761-10764

Distance dependence of the photocatalytic efficiency of TiO 2 revealed by in situ ellipsometry

(4) Carretero Genevrier, Adrián a Boissiere, Cédric a Nicole, Lionel a Grosso, David a

a l'alimentation et l'Environnement (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROLLED THICKNESS; IN-SITU; IN-SITU ELLIPSOMETRY; LAURIC ACID; MESOPOROUS; MESOPOROUS SILICA; MODEL MATERIALS; NANOPARTICLE SURFACE; ORGANIC PHASE; ORGANIC SPECIES; PHOTO CATALYTIC DEGRADATION; PHOTOCATALYTIC ACTIVITIES; PHOTOCATALYTIC EFFICIENCY; PHOTOCATALYZED DEGRADATION; POLLUTANT DIFFUSION; REACTION EFFICIENCY; STACKED LAYER; TIO; UV IRRADIATION;

CHLORINE COMPOUNDS; DEGRADATION; EFFICIENCY; MESOPOROUS MATERIALS; PHOTOCATALYSIS; PHOTODEGRADATION; POLYVINYL CHLORIDES; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY;

TITANIUM DIOXIDE;

LAURIC ACID; NANOCOMPOSITE; NANOPARTICLE; POLYVINYLCHLORIDE; SILICON DIOXIDE; TITANIUM DIOXIDE;

APECTROSCOPIC ELLIPSOMETRY; ARTICLE; DEGRADATION KINETICS; ELLIPSOMETRY; PHOTOCATALYSIS; POLLUTANT; POROSITY; REFRACTION INDEX; THICKNESS; ULTRAVIOLET IRRADIATION;

EID: 84863502627 PISSN: 00027863 EISSN: 15205126 Source Type: Journal
DOI: 10.1021/ja303170h Document Type: Article

Times cited : (44)

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