Template-assisted fabrication of patchy particles with uniform patches

Langmuir

Volumn 28, Issue 26, 2012, Pages 9915-9919

  He, Zhenping ^a   Kretzschmar, Ilona ^a  

^a City University of New York   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE OF INCIDENCE; CONTROLLED SIZE; GLANCING ANGLE DEPOSITION METHODS; MATHEMATICAL CALCULATIONS; METAL VAPOR; PARTICLE DIAMETERS; PATCHY PARTICLES; SCALING ANALYSIS; SHADOWING EFFECTS; SHAPE AND SIZE; STILL MISSING; TEMPLATE-FREE;

MECHANICAL VARIABLES MEASUREMENT; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; VAPORS;

FABRICATION;

EID: 84863462458     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la3017563     Document Type: Article

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