Insights on the influence of surface roughness on photovoltaic properties of state of the art copper indium gallium diselenide thin films solar cells

Journal of Applied Physics

Volumn 111, Issue 11, 2012, Pages

  Jehl, Z ^a   Bouttemy, M ^b   Lincot, D ^a   Guillemoles, J F ^a   Gerard, I ^b   Etcheberry, A ^b   Voorwinden, G ^c   Powalla, M ^d   Naghavi, N ^a  

^a 6 quai Watier   (France)

^b UNIVERSITÉ DE VERSAILLES SAINT QUENTIN EN YVELINES   (France)

^c Wuerth Elektronik Research GmbH   (Germany)

^d ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AS-GROWN; CHEMICAL ETCH; COPPER INDIUM GALLIUM DISELENIDE; CU(IN , GA)SE; CURRENT-VOLTAGE MEASUREMENTS; DIFFUSION LENGTH; EFFECTIVE SPACE; FILL FACTOR; MAIN EFFECT; PHOTOVOLTAIC PARAMETERS; PHOTOVOLTAIC PROPERTY; REFLECTIVITY MEASUREMENTS; SOLAR CELL EFFICIENCIES; STATE OF THE ART; STATE-OF-THE-ART DEVICES; THEORETICAL MODELS; THIN FILMS SOLAR CELLS;

GALLIUM; OPEN CIRCUIT VOLTAGE; PHOTOVOLTAIC EFFECTS; RAMAN SPECTROSCOPY; REFLECTION; SELENIUM COMPOUNDS; SEMICONDUCTING SELENIUM COMPOUNDS; X RAY DIFFRACTION;

SURFACE ROUGHNESS;

EID: 84863316138     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4721648     Document Type: Conference Paper

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