Dielectric screening in extended systems using the self-consistent Sternheimer equation and localized basis sets

Physical Review B - Condensed Matter and Materials Physics

Volumn 85, Issue 24, 2012, Pages

  Hübener, Hannes ^a   Pérez Osorio, Miguel A ^a,b   Ordejón, Pablo ^b   Giustino, Feliciano ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b CATALAN INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY ICN2   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84863306507     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.245125     Document Type: Article

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