4. 2: Integrated scan driver with oxide tfts using floating gate method

Digest of Technical Papers - SID International Symposium

Volumn 42 1, Issue , 2011, Pages 25-27

  Kang, Chul Kyu ^a   Park, Yong Sung ^a   Park, Seong Il ^a   Mo, Yeon Gon ^a   Kim, Byung Hee ^a   Kim, Sang Soo ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

THRESHOLD VOLTAGE;

CIRCUIT OPERATION; COUPLING CAPACITOR; FAST RISE TIME; FLOATING GATES; INITIAL VOLTAGES; MEASURED RESULTS; OFF-STATE CURRENT; OXIDE THINFILM TRANSISTORS (TFTS);

THIN FILM TRANSISTORS;

EID: 84863194468     PISSN: 0097966X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1889/1.3621289     Document Type: Conference Paper

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