Valence evaluation of cerium in nanocrystalline CeO 2 films electrodeposited on Si substrates

Journal of the Electrochemical Society

Volumn 159, Issue 1, 2012, Pages

  Fernandes, V ^a   Graff, I L ^b   Varalda, J ^b   Amaral, L ^c   Fichtner, P ^c   Demaille, D ^d   Zheng, Y ^d   Schreiner, W H ^b   Mosca, D H ^b  

^a INSTITUTO FEDERAL DO PARANÁ   (Brazil)

^b FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^c FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^d INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CERIA THIN FILMS; FLUENCES; NANOCRYSTALLINE FILMS; NANOCRYSTALLINES; OXIDATION STATE; SI (001) SUBSTRATE; SI SUBSTRATES; TRIVALENT CERIUM; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; COMPLEMENTARY TECHNIQUES; NANO-CRYSTALLINE FILMS;

CERIUM COMPOUNDS; ELECTRODEPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; IRRADIATION; OXYGENATION; SILICON; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS;

CERIUM;

EID: 84863157105     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/2.056201jes     Document Type: Article

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