Comparison of x-ray nanotomography and FIB-SEM in quantifying the composite LSM/YSZ SOFC cathode microstructure

ECS Transactions

Volumn 35, Issue 3 PART 3, 2011, Pages 2417-2421

  Nelson, George J ^a   Harris, William M ^a   Lombardo, Jeffrey J ^a   Izzo Jr , John R ^a   Chiu, Wilson K S ^a   Tanasini, Pietro ^b   Cantoni, Marco ^b   Van Herle, Jan ^b   Comninellis, Christos ^b   Andrews, Joy C ^c   Liu, Yijin ^c   Pianetta, Piero ^c   Chu, Yong S ^d  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b EPFL   (Switzerland)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

3D MICROSTRUCTURES; CATHODE MICROSTRUCTURE; CHARACTERIZATION TECHNIQUES; DIFFERENTIAL ABSORPTION; ELEMENTAL MAPPING; FOCUSED ION BEAM-SCANNING ELECTRON MICROSCOPIES; LSM/YSZ; MICRO-STRUCTURAL CHARACTERIZATION; NANOTOMOGRAPHY; NON DESTRUCTIVE; PHASE CONTIGUITY; PHASE VOLUME FRACTION; SERIAL SECTIONING; SPATIAL RESOLUTION; THREE PHASE BOUNDARY; X-RAY NANOTOMOGRAPHY; XRAY IMAGING;

CATHODES; CHARACTERIZATION; MANGANESE; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL;

SOLID OXIDE FUEL CELLS (SOFC);

EID: 84863147432     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.3570238     Document Type: Conference Paper

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