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Volumn 100, Issue 7, 2012, Pages

Sample size effects on the large strain bursts in submicron aluminum pillars

Author keywords

[No Author keywords available]

Indexed keywords

COLLAPSE STRESS; DISLOCATION CONFIGURATIONS; DISLOCATION GENERATION; DISLOCATION NETWORKS; DISLOCATION-FREE; HIGHLY-CORRELATED; IN-SITU TRANSMISSION; LARGE STRAINS; LOW STRESS; POST-COLLAPSE; SAMPLE SIZES; SUBMICRON;

EID: 84863117173     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3681582     Document Type: Article
Times cited : (101)

References (24)
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    • J. R. Greer and W. D. Nix, Phys. Rev. B. 73, 245410 (2006). 10.1103/PhysRevB.73.245410
    • (2006) Phys. Rev. B. , vol.73 , pp. 245410
    • Greer, J.R.1    Nix, W.D.2
  • 4
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    • 10.1016/j.actamat.2009.06.002
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    • (2009) Acta Mater. , vol.57 , pp. 4404
    • Lee, S.W.1    Han, S.M.2    Nix, W.D.3
  • 9
    • 41849114941 scopus 로고    scopus 로고
    • 10.1016/j.actamat.2007.12.016
    • K. S. Ng and A. H. W. Ngan, Acta Mater. 56, 1712 (2008). 10.1016/j.actamat.2007.12.016
    • (2008) Acta Mater. , vol.56 , pp. 1712
    • Ng, K.S.1    Ngan, A.H.W.2
  • 10
    • 67649110349 scopus 로고    scopus 로고
    • 10.1007/s11837-009-0038-2
    • M. D. Uchic, P. A. Shade, and D. M. Dimiduk, JOM 61, 36 (2009). 10.1007/s11837-009-0038-2
    • (2009) JOM , vol.61 , pp. 36
    • Uchic, M.D.1    Shade, P.A.2    Dimiduk, D.M.3
  • 12
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    • 10.1080/14786435.2010.502141
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    • (2011) Philos. Mag. , vol.91 , pp. 1084
    • Nix, W.D.1    Lee, S.W.2
  • 24
    • 84863135863 scopus 로고    scopus 로고
    • See supplementary material at E-APPLAB-100-023206 for movie S1, the movie/snapshot recorded during the compression of the D 165 nm Al pillar inside TEM, and movie S2, the movie/snapshot recorded during the compression of the D 430 nm Al pillar inside TEM.
    • See supplementary material at http://dx.doi.org/10.1063/1.3681582 E-APPLAB-100-023206 for movie S1, the movie/snapshot recorded during the compression of the D 165 nm Al pillar inside TEM, and movie S2, the movie/snapshot recorded during the compression of the D 430 nm Al pillar inside TEM.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.