A transmission electron microscopy study of the effect of interfaces on bubble formation in he-implanted Cu-Nb multilayers

Microscopy and Microanalysis

Volumn 18, Issue 1, 2012, Pages 152-161

  Bhattacharyya, D ^a   Demkowicz, M J ^b   Wang, Y Q ^c   Baumer, R E ^a   Nastasi, M ^a   Misra, A ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b USA   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

He bubbles; interface effects; nanoscale multilayers; transmission electron microscopy

Indexed keywords

EID: 84862911893     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611012219     Document Type: Conference Paper

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