Improved field emission performance of carbon nanotube by introducing copper metallic particles

Nanoscale Research Letters

Volumn 6, Issue , 2011, Pages 1-8

  Chen, Yiren ^a,b   Jiang, Hong ^a   Li, Dabing ^a   Song, Hang ^a   Li, Zhiming ^a   Sun, Xiaojuan ^a,b   Miao, Guoqing ^a   Zhao, Haifeng ^a  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; CONTACT AREAS; CONTINUOUS EMISSION; COPPER PARTICLES; CRITICAL FIELDS; ELECTRICAL CONTACTS; ELECTRON TRANSPORT; ELECTROPHORETIC DEPOSITION TECHNIQUES; EMISSION PERFORMANCE; FIELD EMISSION CURRENTS; INDIUM TIN OXIDE ELECTRODES; ITO ELECTRODES; METALLIC PARTICLES; THERMAL INJURIES; TURN-ON FIELD;

CARBON NANOTUBES; DEPOSITION; ELECTRIC FIELDS; ELECTROPHORESIS; FIELD EMISSION; INDIUM COMPOUNDS; SURFACE ROUGHNESS; TIN; TIN OXIDES;

COPPER;

EID: 84862907493     PISSN: 19317573     EISSN: 1556276X     Source Type: Journal    
DOI: 10.1186/1556-276X-6-537     Document Type: Article

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