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Volumn 520, Issue 9, 2012, Pages 3605-3608
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Relationship between surface plasmon and transmittance enhancement in indium-tin-oxide/Ag/indium-tin-oxide multilayer electrodes
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Author keywords
Annealing; ITO Ag ITO; Scanning Electron Microscopy; Surface plasmon; Transmittance
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Indexed keywords
AG CLUSTERS;
ANNEALING CONDITION;
INDIUM TIN OXIDE;
ITO/AG/ITO;
MULTILAYER ELECTRODES;
PEAK SHIFT;
SCANNING ELECTRONS;
SURFACE FORMATION;
SURFACE PLASMON;
SURFACE PLASMONS;
TRANSMITTANCE;
VISIBLE WAVELENGTHS;
ANNEALING;
ELECTRODES;
INDIUM;
MULTILAYERS;
PLASMONS;
SCANNING ELECTRON MICROSCOPY;
TIN;
TINNING;
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EID: 84862807652
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2011.12.058 Document Type: Article |
Times cited : (21)
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References (13)
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