Fabrication of superhydrophilic and antireflective silica coatings on poly(methyl methacrylate) substrates

Materials Research Bulletin

Volumn 47, Issue 6, 2012, Pages 1562-1567

  Geng, Zhi ^a,b   He, Junhui ^a   Xu, Ligang ^a,b  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

A. Multilayers; A. Nanostructures; D. Optical properties; D. Surface properties

Indexed keywords

ANTIREFLECTIVE; COATING SURFACE; EXPERIMENTAL OBSERVATION; LAYER-BY-LAYER ASSEMBLIES; MESO-PORES; OXYGEN PLASMA TREATMENTS; POROUS SILICA; REFLECTION SPECTRA; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; SILICA COATINGS; SILICA NANOPARTICLES; SUPER-HYDROPHILIC; SURFACE WETTABILITY; UV-VIS SPECTROPHOTOMETERS; WATER DROPLETS; WETTING PROPERTY;

CONTACT ANGLE; ESTERS; OXYGEN; PLASMA APPLICATIONS; SILICA; SUBSTRATES; SURFACE PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

COATINGS;

EID: 84862790108     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2012.02.029     Document Type: Article

References (23)

1. D. Lee, M.F. Rubner, and R. Cohen Nano Lett. 6 2006 2305 2312
2. F.. Cebeci, Z. Wu, L. Zhai, R.E. Cohen, and M.F. Rubner Langmuir 22 2006 2856 2862
3. X. Liu, and J. He J. Phys. Chem. C 113 2009 148 152
4. X. Liu, X. Du, and J. He Chemphyschem 9 2008 305 309
5. Y. Du, L.E. Luna, W.S. Tan, M.F. Rubner, and R.E. Cohen ACS Nano 4 2010 4308 4316
6. S. Baskaran, J. Liu, K. Domansky, N. Kohler, X.H. Li, C. Coyle, G.E. Fryxell, S. Thevuthasan, and R.E. Williford Adv. Mater. 12 2000 291 294
7. Y. Hoshikawa, H. Yabe, A. Nomura, T. Yamaki, A. Shimojima, and T. Okubo Chem. Mater. 22 2010 12 14
8. X. Du, X. Li, and J. He ACS Appl. Mater. Interfaces 2 2010 2365 2372
9. X. Li, X. Du, and J. He Langmuir 26 2010 13528 13534
10. X. Du, and J. He Chem. Eur. J. 17 2011 8165 8174
11. K. Keis, J. Lindgren, S.E. Lindquist, and A. Hagfeldt Langmuir 16 2000 4688 4694
12. G. Decher Science 277 1997 1232 1237
13. W. Stober, and A. Fink J. Colloid Interface Sci. 26 1968 62 69
14. J. He, S. Fujikawa, T. Kunitake, and A. Nakao Chem. Mater. 15 2003 3308 3313
15. J. Bravo, L. Zhai, Z. Wu, R. Cohen, and M. Rubner Langmuir 23 2007 7293 7298
16. X. Du, and J. He Langmuir 27 2011 2972 2979
17. S.E. Yancey, W. Zhong, J.R. Heflin, and A.L. Ritter J. Appl. Phys. 99 2006 034313:1-10
18. B.E. Yoldas Appl. Opt. 19 1980 1425 1429
19. R.N. Wenzel Ind. Eng. Chem. 28 1936 988 994
20. J. Bico, C. Marzolin, and D. Quere Europhys. Lett. 47 1999 743 747
21. J. Bico, C. Tordeux, and D. Quere Europhys. Lett. 55 2001 220 226
22. X.T. Zhang, O. Sato, M. Taguchi, Y. Einaga, T. Murakami, and A. Fujishima Chem. Mater. 17 2005 696 700
23. X. Liu, and J. He J. Colloid Interface Sci. 314 2007 341 345