Formation of a protective layer during IEC(b) test of epoxy resin loaded with silica nanoparticles

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 19, Issue 3, 2012, Pages 786-792

  Meichsner, Christian ^a   Clark, Timothy ^a,b   Groeppel, Peter ^c   Winter, Benjamin ^a   Butz, Benjamin ^a   Spiecker, Erdmann ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b Excellence Cluster Engineering of Advanced Materials   (Germany)

^c SIEMENS AG   (Germany)

Author keywords

Epoxy resin; erosion resistance; nanoparticles; silica; transmissionelectron microscopy

Indexed keywords

EROSION DEPTH; EROSION RESISTANCE; HIGH VOLTAGE INSULATORS; HIGH-VOLTAGE STRESS; IN-SITU FORMATIONS; LASER SCANNING; PROTECTIVE LAYERS; RESIN-BASED COMPOSITE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SILICA NANOPARTICLES; TRANSMISSION ELECTRON MICROSCOPY TEM;

ELECTRIC INSULATION; EROSION; NANOPARTICLES; PARTIAL DISCHARGES; RESINS; SILICA; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

EPOXY RESINS;

EID: 84862702923     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2012.6215081     Document Type: Article

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