Ferroelectric and dielectric properties of 0.6SrBi 2Nb 2O 9-0.4BiFeO 3 thin films

Thin Solid Films

Volumn 460, Issue 1-2, 2004, Pages 1-6

  Xue, J M ^a   Sim, M H ^a   Ezhilvalavan, S ^a   Zhou, Z H ^a   Wang, J ^a   Zhu, H ^b   Miao, J M ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

0.6SrBi 2Nb 2O 9 0.4BiFeO 3; Ferroelectric Thin Films; Sol gel route

Indexed keywords

0.6SRBI2NB2O9-0.4BIFEO3; FERROELECTRIC PROPERTIES; SOL-GEL ROUTES;

ANNEALING; BISMUTH COMPOUNDS; CURRENT DENSITY; DIELECTRIC LOSSES; EVAPORATION; FERROELECTRICITY; PERMITTIVITY; PEROVSKITE; PLATINUM; SOL-GELS; STRONTIUM COMPOUNDS; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC THIN FILMS;

EID: 84862372085     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.079     Document Type: Article

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