How Reliable is X-Ray Fluorescence (XRF) Measurement for Different Metals in Soil Contamination?

Environmental Forensics

Volumn 13, Issue 2, 2012, Pages 110-121

  Wu, Cheng Mau ^a,b   Tsai, Hung Teh ^c   Yang, Kai Hsing ^c   Wen, Jet Chau ^a  

^a NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL CHIAYI UNIVERSITY   (Taiwan)

^c Environmental Protection Administration Taiwan   (Taiwan)

Author keywords

heavy metal; inductively coupled plasma atomic emission spectrometer (ICP AES); relative proximity; soil pollution; x ray fluorescence (XRF)

Indexed keywords

EID: 84862293869     PISSN: 15275922     EISSN: 15275930     Source Type: Journal    
DOI: 10.1080/15275922.2012.676603     Document Type: Article

References (26)

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