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Volumn 100, Issue 23, 2012, Pages

Admittance spectroscopy of Cu 2ZnSnS 4 based thin film solar cells

Author keywords

[No Author keywords available]

Indexed keywords

AC RESPONSE; ADMITTANCE MEASUREMENTS; ADMITTANCE SPECTROSCOPIES; BACK CONTACT; ELECTRICAL PARAMETER; EQUIVALENT CIRCUIT MODEL; FILL FACTOR; METALLIC PRECURSOR; SULPHURIZATION; THIN FILM SOLAR CELLS; TRAP LEVELS; VARYING TEMPERATURE;

EID: 84862134369     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4726042     Document Type: Article
Times cited : (85)

References (17)
  • 11
    • 84862129608 scopus 로고    scopus 로고
    • Electrochemical Impedance Spectroscopy Data Analysis Software, EChem Software, Ann Arbor, Michigan, USA.
    • B. Yeum, Electrochemical Impedance Spectroscopy Data Analysis Software, EChem Software, Ann Arbor, Michigan, USA, 2002.
    • (2002)
    • Yeum, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.