Linear and nonlinear optical changes in amorphous As2Se3 thin film upon UV exposure

Progress in Natural Science: Materials International

Volumn 21, Issue 3, 2011, Pages 205-210

  Chauhan, Rashmi ^a,d   Srivastava, Amit Kumar ^b   Tripathi, Arvind ^c   Srivastava, Krishna Kant ^d  

^a D A V COLLEGE   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

^c Research Foundation for Education and Technology   (India)

^d Dayanand Brajendra Swarup College   (India)

Author keywords

Amorphous chalcogenide thin films; Optical properties; Semi empirical relations; Swanepoel method; UV exposure; Wemple DeDiDomenico model

Indexed keywords

AMORPHOUS FILMS; CHALCOGENIDES; DISPERSION (WAVES); DISPERSIONS; ENERGY GAP; FILM THICKNESS; LIGHT ABSORPTION; NONLINEAR OPTICS; OPTICAL BAND GAPS; OPTICAL CONSTANTS; OPTICAL FILMS; OPTICAL VARIABLES CONTROL; REFRACTIVE INDEX; SELENIUM COMPOUNDS; THICKNESS MEASUREMENT; ULTRAVIOLET VISIBLE SPECTROSCOPY;

AMORPHOUS CHALCOGENIDE; AMORPHOUS CHALCOGENIDE THIN FILM; CHALCOGENIDE THIN FILMS; LINEAR OPTICAL; NON-LINEAR OPTICAL; SEMIEMPIRICAL RELATIONS; SWANEPOEL'S METHOD; THIN-FILMS; UV EXPOSURE; WEMPLE-DEDIDOMENICO MODEL;

THIN FILMS;

EID: 84861901959     PISSN: 10020071     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1002-0071(12)60031-8     Document Type: Article

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