X-ray dark-field imaging modeling

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 29, Issue 6, 2012, Pages 908-912

  Cong, W ^a   Pfeiffer, F ^b   Bech, M ^b   Wang, G ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

X RAY SCATTERING;

CONTRAST MECHANISM; DARK FIELD IMAGES; DARK-FIELD; DENSITY FLUCTUATION; INTENSITY IMAGES; LENGTH SCALE; PHANTOM EXPERIMENT; PHYSICAL MODEL; PRINCIPLE OF ENERGY CONSERVATION; SMALL-ANGLE SCATTERING; STRUCTURAL FEATURE; STRUCTURAL VARIATIONS; TOMOGRAPHIC; VISIBILITY FUNCTION; X-RAY DARK FIELD IMAGING; X-RAY GRATINGS; X-RAY SMALL-ANGLE SCATTERING;

X RAYS;

ARTICLE; COMPUTER ASSISTED TOMOGRAPHY; DARKNESS; IMAGE PROCESSING; IMAGE QUALITY; METHODOLOGY; SMALL ANGLE SCATTERING; THEORETICAL MODEL; X RAY DIFFRACTION;

DARKNESS; IMAGE PROCESSING, COMPUTER-ASSISTED; MODELS, THEORETICAL; PHANTOMS, IMAGING; SCATTERING, SMALL ANGLE; TOMOGRAPHY, X-RAY COMPUTED; X-RAY DIFFRACTION;

EID: 84861886329     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.29.000908     Document Type: Article

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