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Volumn 2012, Issue 5, 2012, Pages
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Statistics of circular interface fluctuations in an off-lattice Eden model
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Author keywords
critical exponents and amplitudes (theory); kinetic roughening (theory); persistence (theory); self affine roughness (theory)
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Indexed keywords
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EID: 84861825577
PISSN: None
EISSN: 17425468
Source Type: Journal
DOI: 10.1088/1742-5468/2012/05/P05007 Document Type: Article |
Times cited : (57)
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References (52)
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