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Volumn 104, Issue 23, 2010, Pages

Universal fluctuations of growing interfaces: Evidence in turbulent liquid crystals

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCONVECTION; EXPERIMENTAL EVIDENCE; INTERFACE FLUCTUATION; LARGEST EIGENVALUES; RANDOM MATRICES; SCALE-INVARIANT; SELF-AFFINE; TEMPORAL SCALING; TURBULENT LIQUIDS; TWO-POINT CORRELATION; UNIVERSAL FLUCTUATIONS;

EID: 77953517950     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.104.230601     Document Type: Article
Times cited : (361)

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