Tin sulfide thin films and Mo/p-SnS/n-CdS/ZnO heterojunctions for photovoltaic applications

Thin Solid Films

Volumn 520, Issue 17, 2012, Pages 5807-5810

  Bashkirov, S A ^a   Gremenok, V F ^a   Ivanov, V A ^a   Lazenka, V V ^b,c   Bente, K ^c  

^a INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Auger electron spectroscopy; Heterojunctions; Hot wall deposition; Solar cells; Thin films; Tin sulfide; X ray diffraction

Indexed keywords

BI-LAYER STRUCTURE; CHEMICAL-BATH DEPOSITION; ELEMENTAL COMPOSITIONS; FILL-FACTOR; GLASS SUBSTRATES; HOT WALL DEPOSITION; PHOTOVOLTAIC APPLICATIONS; PHOTOVOLTAICS; PHYSICAL CHARACTERIZATION; RADIO FREQUENCY MAGNETRON SPUTTERING; SNS FILMS; SNS THIN FILMS; TIN SULFIDE; WINDOW LAYER; ZNO;

AUGER ELECTRON SPECTROSCOPY; CADMIUM COMPOUNDS; CADMIUM SULFIDE; CRYSTAL STRUCTURE; HETEROJUNCTIONS; MOLYBDENUM; OPEN CIRCUIT VOLTAGE; PHOTOVOLTAIC EFFECTS; SOLAR CELLS; SPECTROSCOPIC ANALYSIS; SUBSTRATES; SULFUR COMPOUNDS; THIN FILMS; TIN; VAPOR DEPOSITION; X RAY DIFFRACTION; ZINC OXIDE;

DEPOSITION;

EID: 84861824456     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2012.04.030     Document Type: Article

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