Chip error pattern analysis in IEEE 802.15.4

IEEE Transactions on Mobile Computing

Volumn 11, Issue 4, 2012, Pages 543-552

  Wu, Kaishun ^a,b   Tan, Haoyu ^c   Ngan, Hoi Lun ^c   Liu, Yunhuai ^c   Ni, Lionel M ^c  

^a SUN YAT SEN UNIVERSITY   (China)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Chip error patterns; IEEE 802.15.4; Measurement study; Physical layer (PHY); Pseudonoise (PN) codes

Indexed keywords

ERROR PATTERNS; IEEE 802.15.4; MEASUREMENT STUDY; PHYSICAL LAYERS; PSEUDO-NOISE CODES;

ERROR CORRECTION; MEDIUM ACCESS CONTROL; NETWORK LAYERS; SYSTEMATIC ERRORS;

STANDARDS;

EID: 84861625235     PISSN: 15361233     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMC.2011.44     Document Type: Article

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