Chip error pattern analysis in IEEE 802.15.4

Proceedings - IEEE INFOCOM

Volumn , Issue , 2010, Pages

  Wu, Kaishun ^a,b   Tan, Haoyu ^a   Ngan, Hoi Lun ^a   Ni, Lionel M ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b SUN YAT SEN UNIVERSITY   (China)

Author keywords

Chip error patterns; IEEE 802.15.4; Measurement study; Physical layer (PHY); Pseudonoise (PN) codes

Indexed keywords

CODES (SYMBOLS); DIGITAL DEVICES; ERROR CORRECTION; MEDIUM ACCESS CONTROL; NETWORK LAYERS; SYSTEMATIC ERRORS;

ERROR PATTERNS; IEEE 802.15.4; MEASUREMENT STUDY; PHYSICAL LAYER (PHY); PSEUDO-NOISE CODES;

IEEE STANDARDS;

EID: 77953317040     PISSN: 0743166X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/INFCOM.2010.5462189     Document Type: Conference Paper

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