Sense and non-sense of beam hardening correction in CT metrology

CIRP Annals - Manufacturing Technology

Volumn 61, Issue 1, 2012, Pages 495-498

  Dewulf, Wim ^a,b   Tan, Ye ^a,b   Kiekens, Kim ^a,b  

^a Department of Obstetrics and Gynaecology   (Belgium)

^b UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

Metrology; Uncertainty; X ray computed tomography

Indexed keywords

BEAM HARDENING; BEAM HARDENING CORRECTION; BEAM HARDENING EFFECTS; COMPUTED TOMOGRAPHY; MATERIAL ANALYSIS; MEASUREMENT ACCURACY; MEASUREMENT UNCERTAINTY; SURROUNDING MATERIALS; SYSTEMATIC INVESTIGATIONS; UNCERTAINTY; X RAY BEAM; X-RAY COMPUTED TOMOGRAPHY;

HARDENING; IMAGE QUALITY; MEASUREMENTS; UNCERTAINTY ANALYSIS; UNITS OF MEASUREMENT;

COMPUTERIZED TOMOGRAPHY;

EID: 84861624350     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2012.03.013     Document Type: Article

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