Characterization of CdS 1-xSe x thin films by chemical bath deposition technique

Optik

Volumn 123, Issue 13, 2012, Pages 1196-1200

  Mariappan, R ^a   Ponnuswamy, V ^a   Ragavendar, M ^b  

^a SRI RAMAKRISHNA MISSION VIDYALAYA COLLEGE OF ARTS AND SCIENCE   (India)

^b RVS COLLEGE OF ENGINEERING AND TECHNOLOGY   (India)

Author keywords

CdS 1 xSe x thin films; EDAX; Optical properties; SEM; XRD

Indexed keywords

ANNEALING TEMPERATURES; AQUEOUS MEDIA; CDS; CHEMICAL BATH; CHEMICAL BATH DEPOSITION TECHNIQUE; COATED GLASS SUBSTRATES; DISLOCATION DENSITIES; ENERGY DISPERSIVE ANALYSIS; GRAIN SIZE; HEXAGONAL STRUCTURES; MICRO-STRAIN; MICROSTRUCTURAL PARAMETERS; POLYCRYSTALLINE; SELENIDES; UV-VIS-NIR SPECTROPHOTOMETERS; X RAY DIFFRACTOMETERS; XRD;

CADMIUM; CADMIUM COMPOUNDS; CADMIUM SULFIDE; DEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84861579187     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2011.07.050     Document Type: Article

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