Structural disorder in CdS x Se 1-x films probed by microdiffraction experiments

Applied Surface Science

Volumn 186, Issue 1-4, 2002, Pages 527-532

  Pagliara, S ^a   Sangaletti, L ^a   Depero, L E ^b   Capozzi, V ^c,d   Perna, G ^d  

^a UNIVERSITÀ CATTOLICA DEL SACRO CUORE   (Italy)

^b UNIVERSITY OF BRESCIA   (Italy)

^c UNIVERSITY OF FOGGIA   (Italy)

^d UNIVERSITY OF BARI   (Italy)

Author keywords

Alloy; CdSSe; Disorder; Exciton; Microdiffraction; Photoluminescence

Indexed keywords

ALLOYING; CRYSTAL DEFECTS; DIFFRACTOMETERS; EPITAXIAL GROWTH; EXCITONS; FILM GROWTH; PHOTOLUMINESCENCE; SEMICONDUCTING CADMIUM COMPOUNDS; STRUCTURE (COMPOSITION); THIN FILMS; X RAY DIFFRACTION ANALYSIS;

MICRODIFFRACTION EXPERIMENTS;

METALLIC FILMS;

EID: 0037185110     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00762-0     Document Type: Conference Paper

References (11)