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Volumn 134, Issue 2-3, 2012, Pages 851-857

Vacuum deposited WO 3 thin films based sub-ppm H 2S sensor

Author keywords

Defects; Surface properties; Thin films; Vacuum deposition

Indexed keywords

AU LOADING; ENHANCED SENSITIVITY; GAS CONCENTRATION; OPERATING TEMPERATURE; OPTIMUM CONDITIONS; RESPONSE KINETICS; SENSING PROPERTY; SENSITIVITY VALUES; SENSOR FILMS; SIMPLE METHOD; THIN FILM SENSORS; WORK FUNCTION MEASUREMENTS;

EID: 84861530207     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2012.03.080     Document Type: Article
Times cited : (44)

References (29)
  • 22
    • 79958004828 scopus 로고    scopus 로고
    • JCPDS Int. Centre Diffract. Data PA 19073-3273, U.S.A.
    • Powder Diffract, File 2001 JCPDS Int. Centre Diffract. Data PA 19073-3273, U.S.A.
    • (2001) Powder Diffract, File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.