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Volumn 717-720, Issue , 2012, Pages 649-652
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Decoupling the graphene buffer layer from SiC(0001) via interface oxidation
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Author keywords
ARPES; Graphene; Intercalation; Oxidation; Raman spectroscopy; Si face; XPS
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Indexed keywords
GRAPHENE;
INTERCALATION;
OXIDATION;
OXYGEN;
PHOTOELECTRON SPECTROSCOPY;
RAMAN SPECTROSCOPY;
SILICON CARBIDE;
X RAY PHOTOELECTRON SPECTROSCOPY;
ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY;
ARPES;
COVALENTLY BOUND;
DECOUPLING EFFECTS;
EPITAXIAL GRAPHENE;
GRAPHENE LAYERS;
PHOTOELECTRON SPECTROSCOPY (XPS);
SI FACES;
BUFFER LAYERS;
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EID: 84861407031
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.717-720.649 Document Type: Conference Paper |
Times cited : (19)
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References (9)
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