Impedance spectroscopy of dye-sensitized solar cells: Analysis of measurement and fitting errors

Journal of the Electrochemical Society

Volumn 159, Issue 6, 2012, Pages

  Jennings, James R ^a   Wang, Qing ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYSIS OF MEASUREMENTS; CONFIDENCE INTERVAL; DYE-SENSITIZED SOLAR CELL; EQUIVALENT CIRCUIT MODEL; FITTING ERROR; IMPEDANCE MEASUREMENT; IMPEDANCE SPECTROSCOPY; MAIN TRANSMISSION LINES; MEASUREMENT MODEL; MONTE CARLO; MONTE CARLO SIMULATION; NOISE LEVELS; REPLICATE MEASUREMENTS; STANDARD ERRORS;

ELECTRIC LINES; INTELLIGENT SYSTEMS; PARAMETER EXTRACTION; PHOTOELECTROCHEMICAL CELLS; SOLAR CELLS; TRANSMISSION LINE THEORY; VOLTAGE MEASUREMENT;

MEASUREMENT ERRORS;

EID: 84861405275     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/2.062206jes     Document Type: Article

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