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Volumn 143, Issue 12, 1996, Pages 4074-4079

Optically stimulated deep-level impedance spectroscopy: Application to an n-GaAs Schottky diode

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS; MATHEMATICAL MODELS; REGRESSION ANALYSIS; SCHOTTKY BARRIER DIODES; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0030394932     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837338     Document Type: Article
Times cited : (6)

References (35)
  • 20
    • 0001839045 scopus 로고
    • S. T. Pantelides, Editor, Gordon and Breach Sci. Pub., New York
    • G. M. Martin and S. Makram-Ebeid, in Deep Centers in Semiconductors, S. T. Pantelides, Editor, p. 455, Gordon and Breach Sci. Pub., New York (1986).
    • (1986) Deep Centers in Semiconductors , pp. 455
    • Martin, G.M.1    Makram-Ebeid, S.2
  • 34
    • 5844419135 scopus 로고
    • S. T. Pantelides, Editor, Gordon and Breach Sci. Pub., New York
    • D. V. Lang, in Deep Centers in Semiconductors, S. T. Pantelides, Editor, p. 492, Gordon and Breach Sci. Pub., New York (1986).
    • (1986) Deep Centers in Semiconductors , pp. 492
    • Lang, D.V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.