-
2
-
-
0022099146
-
Controlled methylation of quartz particles
-
Blake, P.; Ralston, J. Controlled methylation of quartz particles Colloids Surf. 1985, 15, 101-118
-
(1985)
Colloids Surf.
, vol.15
, pp. 101-118
-
-
Blake, P.1
Ralston, J.2
-
3
-
-
0022146003
-
Particle size, surface coverage and flotation response
-
Blake, P.; Ralston, J. Particle size, surface coverage and flotation response Colloids Surf. 1985, 16, 41-53
-
(1985)
Colloids Surf.
, vol.16
, pp. 41-53
-
-
Blake, P.1
Ralston, J.2
-
4
-
-
0024010163
-
The influence of particle size and contact angle in mineral flotation
-
Crawford, R.; Ralston, J. The influence of particle size and contact angle in mineral flotation Int. J. Miner. Proc. 1988, 23, 1-24
-
(1988)
Int. J. Miner. Proc.
, vol.23
, pp. 1-24
-
-
Crawford, R.1
Ralston, J.2
-
5
-
-
0033199736
-
Particle-bubble attachment in mineral flotation
-
Dai, Z.; Fornasiero, D.; Ralston, J. Particle-bubble attachment in mineral flotation J. Colloid Interface Sci. 1999, 217, 70-76
-
(1999)
J. Colloid Interface Sci.
, vol.217
, pp. 70-76
-
-
Dai, Z.1
Fornasiero, D.2
Ralston, J.3
-
6
-
-
70149098688
-
The effect of particle shape and hydrophobicity in flotation
-
Koh, P. T. L.; Hao, F. P.; Smith, L. K.; Chau, T. T.; Bruckard, W. J. The effect of particle shape and hydrophobicity in flotation Int. J. Miner. Proc. 2009, 93, 128-134
-
(2009)
Int. J. Miner. Proc.
, vol.93
, pp. 128-134
-
-
Koh, P.T.L.1
Hao, F.P.2
Smith, L.K.3
Chau, T.T.4
Bruckard, W.J.5
-
7
-
-
0002960889
-
The effect of surface heterogeneity on pseudo-line tension and the flotation limit of fine particles
-
Drelich, J.; Miller, J. D. The effect of surface heterogeneity on pseudo-line tension and the flotation limit of fine particles Colloids Surf. 1992, 69, 35-43
-
(1992)
Colloids Surf.
, vol.69
, pp. 35-43
-
-
Drelich, J.1
Miller, J.D.2
-
8
-
-
0028465789
-
Atomic force microscopy imaging of thin films formed by hydrophobing reagents
-
Biggs, S.; Grieser, F. Atomic force microscopy imaging of thin films formed by hydrophobing reagents J. Colloid Interface Sci. 1994, 165, 425-430
-
(1994)
J. Colloid Interface Sci.
, vol.165
, pp. 425-430
-
-
Biggs, S.1
Grieser, F.2
-
9
-
-
0038756350
-
Very small bubble formation at the solid-water interface
-
Yang, J. W.; Duan, J. M.; Fornasiero, D.; Ralston, J. Very small bubble formation at the solid-water interface J. Phys. Chem. B 2003, 107, 6139-6147
-
(2003)
J. Phys. Chem. B
, vol.107
, pp. 6139-6147
-
-
Yang, J.W.1
Duan, J.M.2
Fornasiero, D.3
Ralston, J.4
-
10
-
-
0023427857
-
Contact angles on particles and plates
-
Crawford, R.; Koopal, L. K.; Ralston, J. Contact angles on particles and plates Colloids Surf. 1987, 27, 57-64
-
(1987)
Colloids Surf.
, vol.27
, pp. 57-64
-
-
Crawford, R.1
Koopal, L.K.2
Ralston, J.3
-
11
-
-
0029375432
-
Static SIMS study of hydroxylation of low-surface-area silica
-
Wood, B. J.; Lamb, R. N.; Raston, C. L. Static SIMS study of hydroxylation of low-surface-area silica Surf. Interface Anal. 1995, 23, 680-688
-
(1995)
Surf. Interface Anal.
, vol.23
, pp. 680-688
-
-
Wood, B.J.1
Lamb, R.N.2
Raston, C.L.3
-
13
-
-
40649107120
-
Inferring wettability of heterogeneous surfaces by ToF-SIMS
-
Priest, C.; Stevens, N.; Sedev, R.; Skinner, W.; Ralston, J. Inferring wettability of heterogeneous surfaces by ToF-SIMS J. Colloid Interface Sci. 2008, 320, 563-568
-
(2008)
J. Colloid Interface Sci.
, vol.320
, pp. 563-568
-
-
Priest, C.1
Stevens, N.2
Sedev, R.3
Skinner, W.4
Ralston, J.5
-
14
-
-
15844387738
-
Thermally- and photoinduced changes in the water wettability of low-surface-area silica and titania
-
Kanta, A.; Sedev, R.; Ralston, J. Thermally- and photoinduced changes in the water wettability of low-surface-area silica and titania Langmuir 2005, 21, 2400-2407
-
(2005)
Langmuir
, vol.21
, pp. 2400-2407
-
-
Kanta, A.1
Sedev, R.2
Ralston, J.3
-
15
-
-
0033534936
-
Surface OH group governing adsorption properties of metal oxide films
-
Takeda, S.; Fukawa, M.; Hayashi, Y.; Matsumoto, K. Surface OH group governing adsorption properties of metal oxide films Thin Solid Films 1999, 339, 220-224
-
(1999)
Thin Solid Films
, vol.339
, pp. 220-224
-
-
Takeda, S.1
Fukawa, M.2
Hayashi, Y.3
Matsumoto, K.4
-
16
-
-
0000970147
-
The relation between lift-off of photoresist and the surface coverage of trimethylsiloxy groups on silicon wafers: A quantitative time-of-flight secondary ion mass spectrometry and contact angle study
-
Pongeé, J. J.; Marriot, V. B.; Michielsen, M. C. B. A.; Touwslager, F. J.; Velzen, P. N. T. v.; Wel, H. v. d. The relation between lift-off of photoresist and the surface coverage of trimethylsiloxy groups on silicon wafers: a quantitative time-of-flight secondary ion mass spectrometry and contact angle study J. Vac. Sci. Technol. 1990, 8, 463-466
-
(1990)
J. Vac. Sci. Technol.
, vol.8
, pp. 463-466
-
-
Pongeé, J.J.1
Marriot, V.B.2
Michielsen, M.C.B.A.3
Touwslager, F.J.4
Velzen, P.N.T.V.5
Wel, H.V.D.6
-
17
-
-
0000037462
-
Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
-
Benninghoven, A. Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS) Surf. Sci. 1973, 35, 427-457
-
(1973)
Surf. Sci.
, vol.35
, pp. 427-457
-
-
Benninghoven, A.1
-
18
-
-
0024621989
-
High mass resolution time-of-flight secondary ion mass spectrometry - Application to peak assignments
-
Niehuis, E.; Vanvelzen, P. N. T.; Lub, J.; Heller, T.; Benninghoven, A. High mass resolution time-of-flight secondary ion mass spectrometry-Application to peak assignments Surf. Interface Anal. 1989, 14, 135-142
-
(1989)
Surf. Interface Anal.
, vol.14
, pp. 135-142
-
-
Niehuis, E.1
Vanvelzen, P.N.T.2
Lub, J.3
Heller, T.4
Benninghoven, A.5
-
19
-
-
0024666240
-
The kinetics of a surface-chemical reaction: A time-of-flight secondary ion mass spectrometry study
-
van Velzen, P. N. T.; Ponjeé, J. J.; Benninghoven, A. The kinetics of a surface-chemical reaction: a time-of-flight secondary ion mass spectrometry study Appl. Surf. Sci. 1989, 37, 147-159
-
(1989)
Appl. Surf. Sci.
, vol.37
, pp. 147-159
-
-
Van Velzen, P.N.T.1
Ponjeé, J.J.2
Benninghoven, A.3
-
20
-
-
77952803625
-
ToF-SIMS as a new method to determine the contact angle of mineral surfaces
-
Brito e Abreu, S.; Brien, C.; Skinner, W. ToF-SIMS as a new method to determine the contact angle of mineral surfaces Langmuir 2010, 26, 8122-8130
-
(2010)
Langmuir
, vol.26
, pp. 8122-8130
-
-
Brito Abreu E, S.1
Brien, C.2
Skinner, W.3
-
21
-
-
78650522526
-
ToF-SIMS-derived hydrophobicity in DTP flotation of chalcopyrite: Contact angle distributions in flotation streams
-
Brito e Abreu, S.; Skinner, W. ToF-SIMS-derived hydrophobicity in DTP flotation of chalcopyrite: contact angle distributions in flotation streams Int. J. Miner. Proc. 2011, 98, 35-41
-
(2011)
Int. J. Miner. Proc.
, vol.98
, pp. 35-41
-
-
Brito Abreu E, S.1
Skinner, W.2
-
22
-
-
0037447009
-
Wettability of photoresponsive titanium dioxide surfaces
-
Stevens, N.; Priest, C. I.; Sedev, R.; Ralston, J. Wettability of photoresponsive titanium dioxide surfaces Langmuir 2003, 19, 3272-3275
-
(2003)
Langmuir
, vol.19
, pp. 3272-3275
-
-
Stevens, N.1
Priest, C.I.2
Sedev, R.3
Ralston, J.4
-
23
-
-
84861154450
-
-
National Institutes of Health: Bethesda, MD.
-
Rasband, W. ImageJ, version 1.35; National Institutes of Health: Bethesda, MD, 2006, http://rsb.info.nih.gov/ij/.
-
(2006)
ImageJ, Version 1.35
-
-
Rasband, W.1
-
27
-
-
84945593859
-
Contact angle, wetting and adhesion: A critical review
-
Good, R. J. Contact angle, wetting and adhesion: a critical review J. Adhes. Sci. Technol. 1992, 6, 1269-1302
-
(1992)
J. Adhes. Sci. Technol.
, vol.6
, pp. 1269-1302
-
-
Good, R.J.1
-
28
-
-
4344618755
-
Controlled wettability of quartz surfaces
-
Lamb, R. N.; Furlong, D. N. Controlled wettability of quartz surfaces J. Chem. Soc., Faraday Trans. 1 1982, 78, 61-73
-
(1982)
J. Chem. Soc., Faraday Trans. 1
, vol.78
, pp. 61-73
-
-
Lamb, R.N.1
Furlong, D.N.2
-
30
-
-
0008007545
-
The Chemical Structure of Solid Surfaces as Deduced from Contact Angles
-
In; Fowkes, F. M. Zisman, W. A. Advances in Chemistry Series; American Chemical Society: Washington, DC, Vol.
-
Adam, N. K. The Chemical Structure of Solid Surfaces as Deduced from Contact Angles. In Contact Angle, Wettability, and Adhesion; Fowkes, F. M.; Zisman, W. A., Eds.; Advances in Chemistry Series; American Chemical Society: Washington, DC, 1964; Vol. 43, pp 52-56.
-
(1964)
Contact Angle, Wettability, and Adhesion
, vol.43
, pp. 52-56
-
-
Adam, N.K.1
-
31
-
-
0026256441
-
Characterization of the wettability of solid particles by film flotation. 1. Experimental investigation
-
Fuerstenau, D. W.; Diao, J.; Williams, M. C. Characterization of the wettability of solid particles by film flotation. 1. Experimental investigation Colloids Surf. 1991, 60, 127-144
-
(1991)
Colloids Surf.
, vol.60
, pp. 127-144
-
-
Fuerstenau, D.W.1
Diao, J.2
Williams, M.C.3
-
32
-
-
36049021817
-
The limits of fine and coarse particle flotation
-
Gontijo, C. D. F.; Fornasiero, D.; Ralston, J. The limits of fine and coarse particle flotation Can. J. Chem. Eng. 2007, 85, 739-747
-
(2007)
Can. J. Chem. Eng.
, vol.85
, pp. 739-747
-
-
Gontijo, C.D.F.1
Fornasiero, D.2
Ralston, J.3
-
33
-
-
78449248927
-
The dependency of the critical contact angle for flotation on particle size - Modelling the limits of fine particle flotation
-
Chipfunhu, D.; Zanin, M.; Grano, S. The dependency of the critical contact angle for flotation on particle size-Modelling the limits of fine particle flotation Miner. Eng. 2011, 24, 50-57
-
(2011)
Miner. Eng.
, vol.24
, pp. 50-57
-
-
Chipfunhu, D.1
Zanin, M.2
Grano, S.3
-
34
-
-
34548193292
-
The dynamics of capillary flow
-
Washburn, E. W. The dynamics of capillary flow Phys. Rev. 1921, 17, 273-283
-
(1921)
Phys. Rev.
, vol.17
, pp. 273-283
-
-
Washburn, E.W.1
-
35
-
-
0025398840
-
The wetting of angular quartz particles - Capillary-pressure and contact angles
-
Diggins, D.; Fokkink, L. G. J.; Ralston, J. The wetting of angular quartz particles-capillary-pressure and contact angles Colloids Surf. 1990, 44, 299-313
-
(1990)
Colloids Surf.
, vol.44
, pp. 299-313
-
-
Diggins, D.1
Fokkink, L.G.J.2
Ralston, J.3
|