ToF-SIMS as a new method to determine the contact angle of mineral surfaces

Langmuir

Volumn 26, Issue 11, 2010, Pages 8122-8130

  Brito E Abreu, Susana ^a   Brien, Chris ^a   Skinner, William ^a  

^a UNIVERSITY OF SOUTH AUSTRALIA   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FLAT SURFACES; MATERIAL SYSTEMS; MINERAL PARTICLES; MINERAL SURFACES; MULTIVARIATE STATISTICAL TECHNIQUES; SECONDARY IONS; SURFACE SPECIES; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

CAPILLARITY; CONTACT ANGLE; COPPER COMPOUNDS; HYDROPHOBICITY; MINERALS; MULTIVARIANT ANALYSIS; OXYGEN; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICATE MINERALS; SULFUR; SURFACE ANALYSIS; SURFACE CHEMISTRY;

SURFACES;

EID: 77952803625     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la904443s     Document Type: Article

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