Identification of failure mechanisms to enhance prognostic outcomes

Journal of Failure Analysis and Prevention

Volumn 12, Issue 1, 2012, Pages 66-73

  Mathew, Sony ^a   Alam, Mohammed ^a   Pecht, Michael ^a,b  

^a UNIVERSITY OF MARYLAND   (United States)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Failure mechanisms; Fusion prognostics; Physics of failure; Precursor parameters; Remaining life

Indexed keywords

DATA-DRIVEN APPROACH; EFFECTS ANALYSIS; FAILURE MECHANISM; PHYSICS-OF-FAILURE; PRECURSOR PARAMETERS; REMAINING LIFE; SYSTEM RISK; TIME TO FAILURE;

MACHINERY; RISK PERCEPTION; SYSTEMS ENGINEERING;

IDENTIFICATION (CONTROL SYSTEMS);

EID: 84861092334     PISSN: 15477029     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11668-011-9508-2     Document Type: Review

References (22)

1. Pecht, M.: Prognostics and Health Management of Electronics. Wiley-Interscience, New York, NY (2008)
2. DoD 5000.2 Policy Document: Defense Acquisition Guidebook, Chapter 5.3-Performance Based Logistics (2004)
3. Vichare, N., Pecht, M.: Prognostics and health management of electronics. IEEE Trans. Compon. Packag. Technol. 29(1), 222-229 (2006) (Pubitemid 43348954)
4. Pecht, M., Dasgupta, A.: Physics-of-failure: an approach to reliable product development. J. Inst. Environ. Sci. 38, 30-34 (1995)
5. Ganesan, S., Eveloy, V., Das, D., Pecht, M.: Identification and utilization of failure mechanisms to enhance FMEA and FMECA. In: Proceedings of the IEEE Workshop on Accelerated Stress Testing & Reliability (ASTR), Austin, Texas, October 2-5, 2005
6. IEEE Standard 1413.1-2002: IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413. IEEE Standard (2003)
7. JESD659-A: Failure-Mechanism-Driven Reliability Monitoring. EIA/JEDEC Standard (1999)
8. JEP143A: Solid-State Reliability Assessment and Qualification Methodologies. JEDEC Publication (2004)
9. JEP150: Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface-Mount Components. JEDEC Publication (2005)
10. JESD74: Early Life Failure Rate Calculation Procedure for Electronic Components. JEDEC Standard (2000)
11. JESD94: Application Specific Qualification Using Knowledge Based Test Methodology. JEDEC Standard (2004)
12. JESD91A: Method for Developing Acceleration Models for Electronic Component Failure Mechanisms. JEDEC Standard (2003)
13. SEMATECH, #00053955A-XFR: Semiconductor Device Reliability Failure Models. SEMATECH Publication (2000)
14. SEMATECH, #00053958A-XFR: Knowledge-Based Reliability Qualification Testing of Silicon Devices. SEMATECH Publication (2000)
15. SEMATECH, #04034510A-TR: Comparing the Effectiveness of Stress-Based Reliability Qualification Stress Conditions. SEMATECH Publication (2004)
16. SEMATECH, # 99083810A-XFR: Use Condition Based Reliability Evaluation of New Semiconductor Technologies. SEMATECH Publication (1999)
17. Gu, J., Pecht, M.: Prognostics and Health Management Using Physics of Failure. In: 54th Annual Reliability and Maintainability Symposium (RAMS), Las Vegas, Nevada, January 2008
18. Cheng, S., Pecht, M.: A Fusion Prognostics Method for Remaining Useful Life Prediction of Electronic Products. In: 5th Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, August 22-25, 2009
19. Brown, G.: How PC power supplies work [Online]. http://computer. howstuffworks.com/power-supply.htm. Accessed 24 Jan 2011
20. Chen, Y., Chou, M., Wu, H.: Electrolytic capacitor failure prediction of LC filter for switching-mode power convertors. In: Industry Applications Conference, pp. 1464-1469 (2005) (Pubitemid 44042642)
21. Orsagh, R., Brown, D., Roemer, M., Dabney, T., Hess, A.: Prognostic health management for avionics system power supplies. In: IEEE Aerospace Conference, Big Sky, MT, pp. 3585-3592 (2005)
22. Goodman, D., Vermeire, B., Spuhler, P., Venkatramani, H.: Practical application of PHM/prognostics to COTS power convertors. In IEEE Aerospace Conference, Big Sky, MT, pp. 3573-3578 (2005)