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Volumn , Issue , 2011, Pages 003659-003662

Microstructural investigation of new thick-film paste flux for contacting silicon solar cells

Author keywords

[No Author keywords available]

Indexed keywords

AG CONTACTS; C-SI SOLAR CELL; CELL PERFORMANCE; CRYSTALLINE SILICONS; CURRENT CONDUCTION MECHANISMS; MICROSCOPY TECHNIQUE; MICROSTRUCTURAL INVESTIGATION; P-TYPE; SERIES RESISTANCES; ULTRA-THIN;

EID: 84861085163     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6185944     Document Type: Conference Paper
Times cited : (3)

References (8)
  • 1
    • 84861032405 scopus 로고    scopus 로고
    • http://www2.dupont.com/Photovoltaics/en-US/.
  • 7
    • 63749108933 scopus 로고    scopus 로고
    • Electron Microscopy Study of Front-Side Ag Contact in Crystalline Si Solar Cells
    • Z.G. Li, L. Liang, L.K. Cheng, "Electron Microscopy Study of Front-Side Ag Contact in Crystalline Si Solar Cells", J. Appl. Physics 105, 2009, pp66102-66104.
    • (2009) J. Appl. Physics , vol.105 , pp. 66102-66104
    • Li, Z.G.1    Liang, L.2    Cheng, L.K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.