Loss analysis of back-contact back-junction thin-film monocrystalline silicon solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 002874-002877

  Haase, F ^a   Eidelloth, S ^a   Horbelt, R ^a,c   Bothe, K ^a   Rojas, E Garralaga ^a   Brendel, R ^a,b  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^c UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EFFICIENCY LOSS; ENERGY LOSS ANALYSIS; FINITE ELEMENT MODELING; HIGH SATURATION CURRENT; LOSS ANALYSIS; LOSS MECHANISMS; METAL-SILICON INTERFACES; MONOCRYSTALLINE; POROUS SI; POWER-LOSSES; RESISTANCE NETWORK; THIN-FILM SILICON SOLAR CELLS;

COMPUTER SIMULATION; ENERGY DISSIPATION; PHOTOVOLTAIC EFFECTS; POROUS SILICON; SILICON SOLAR CELLS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 84861084143     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6186546     Document Type: Conference Paper

References (10)

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