A novel way to characterize metal-insulator-metal devices via nanoindentation

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2011, Pages 001754-001757

  Periasamy, Prakash ^a,b   O'Hayre, Ryan P ^a   Berry, Joseph J ^b   Parilla, Philip A ^b   Ginley, David S ^b   Packard, Corinne E ^a,b  

^a Department of Metallurgical and Materials Engineering   (United States)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BASE LAYERS; CONTACT AREAS; CURRENT-VOLTAGE RESPONSE; DEVICE PERFORMANCE; ELECTRICAL CONTACT RESISTANCE; ELECTRICALLY CONDUCTIVE; IN-SITU; METAL INSULATOR METALS; METAL INSULATORS; METAL TIP; MIM DIODES; MIM STRUCTURE; NANOINDENTERS; NON-LINEARITY; PRECISE CONTROL; PROBE TIPS; RECTENNAS; SI SUBSTRATES; VERY HIGH FREQUENCY;

DIAMONDS; DIODES; MATERIALS PROPERTIES; METAL INSULATOR BOUNDARIES; METALS; NANOINDENTATION; PHOTOVOLTAIC EFFECTS; POINT CONTACTS; WIRE;

MIM DEVICES;

EID: 84861058088     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2011.6186293     Document Type: Conference Paper

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