Crystal growth of PZN-PT single crystals and critical issues for higher piezoelectric coefficient

Crystal Research and Technology

Volumn 47, Issue 5, 2012, Pages 523-529

  Srimathy, B ^a   Jayavel, R ^a   Ganesamoorthy, S ^b   Bhaumik, I ^b   Karnal, A K ^b   Natarajan, V ^c   Varadarajan, E ^c   Kumar, J ^a  

^a ANNA UNIVERSITY   (India)

^b RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

^c NAVAL PHYSICAL AND OCEANOGRAPHIC LABORATORY   (India)

Author keywords

ferroelectric materials; optical microscopy; perovskites; piezoelectric materials; single crystal growth; X ray diffraction

Indexed keywords

AS-GROWN; COMPOSITIONAL VARIATION; CRITICAL ISSUES; DIELECTRIC MEASUREMENTS; FLUX METHODS; GROWN CRYSTALS; MORPHOLOGICAL ASPECTS; OCTAHEDRAL LATTICE; ORDERED DOMAINS; PIEZOELECTRIC COEFFICIENT; SCAN RATES; STRUCTURAL INFLUENCES; TRANSMISSION SPECTRUMS; XRD;

CRYSTAL GROWTH; FERROELECTRIC MATERIALS; LEAD; LEAD OXIDE; OPTICAL MICROSCOPY; PEROVSKITE; PIEZOELECTRIC MATERIALS; X RAY DIFFRACTION;

SINGLE CRYSTALS;

EID: 84860698258     PISSN: 02321300     EISSN: 15214079     Source Type: Journal    
DOI: 10.1002/crat.201100580     Document Type: Article

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