Measurement of an exceptionally weak electron-phonon coupling on the surface of the topological insulator Bi 2Se 3 using angle-resolved photoemission spectroscopy

Physical Review Letters

Volumn 108, Issue 18, 2012, Pages

  Pan, Z H ^a   Fedorov, A V ^b   Gardner, D ^c   Lee, Y S ^c   Chu, S ^d   Valla, T ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; ELECTRON PHONON COUPLINGS; ELECTRONIC DEVICE; HIGH-RESOLUTION ANGLE-RESOLVED PHOTOEMISSION SPECTROSCOPIES; LOW ENERGIES; NON-MAGNETIC IMPURITIES; ROOM TEMPERATURE; SCATTERING RATES; TEMPERATURE DEPENDENCE; TOPOLOGICAL INSULATORS;

ELASTIC SCATTERING; ELECTRON CORRELATIONS; ELECTRON-PHONON INTERACTIONS; ELECTRONIC STRUCTURE; PHOTOELECTRON SPECTROSCOPY; SURFACE STATES; TOPOLOGY;

ELECTRIC INSULATORS;

EID: 84860628751     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.108.187001     Document Type: Article

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