Key experimental information on intermediate-range atomic structures in amorphous Ge 2Sb 2Te 5 phase change material

Journal of Applied Physics

Volumn 111, Issue 8, 2012, Pages

  Hosokawa, Shinya ^a,b,e   Pilgrim, Wolf Christian ^b   Hhle, Astrid ^b   Szubrin, Daniel ^b   Boudet, Nathalie ^c   Brar, Jean Franois ^c   Maruyama, Kenji ^d  

^a HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

^b PHILIPPS UNIVERSITY MARBURG   (Germany)

^c CNRS   (France)

^d NIIGATA UNIVERSITY   (Japan)

^e KUMAMOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS PHASE; ANOMALOUS X-RAY SCATTERING; ATOMIC CONFIGURATION; BLU-RAY DISK; CRYSTALLINE PHASIS; CRYSTALLINE-AMORPHOUS PHASE; DIGITAL VERSATILE DISKS; FAST PROCESS; GE ATOM; GE-SB-TE; LASER INDUCED; LONG LASTING; OPTICAL STORAGE DEVICES; PHASE CHANGE PROCESS; REVERSE MONTE CARLO MODELING; REWRITABLE; SHORT RANGE ORDERS; STRUCTURAL INFORMATION; X RAY ABSORPTION FINE STRUCTURES;

ACTIVATION ENERGY; AMORPHOUS ALLOYS; ATOMS; CRYSTALLINE MATERIALS; GERMANIUM; LASER RECORDING; PHASE CHANGE MATERIALS; VIDEODISKS; VIRTUAL STORAGE;

ANTIMONY;

EID: 84860540571     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3703570     Document Type: Article

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