Re-evaluation of the slip correction parameter of certified PSL spheres using a nanometer differential mobility analyzer (NDMA)

Journal of Aerosol Science

Volumn 51, Issue , 2012, Pages 24-34

  Jung, Haesung ^a   Mulholland, George W ^b   Pui, David Y H ^c   Kim, Jung Hyeun ^a  

^a University of Seoul   (South Korea)

^b UNIVERSITY OF MARYLAND   (United States)

^c University of Minnesota   (United States)

Author keywords

Drag force; Electrical mobility; Electrospray; Free molecular regime; Low pressure system; Slip correction factor

Indexed keywords

CURVE FITTING; DRAG;

DRAG FORCES; ELECTRICAL MOBILITY; ELECTROSPRAYS; FREE MOLECULAR REGIME; LOW PRESSURE SYSTEMS; SLIP CORRECTION FACTORS;

REFLECTIVE COATINGS;

DRAG; EQUIPMENT; ERROR CORRECTION; LOW PRESSURE SYSTEM; MOBILITY; PARAMETERIZATION; PARTICLE SIZE; POLYMER; REFLECTIVITY; SPHERE; STANDARD (REFERENCE);

AEROSOL; ANALYZER; ARTICLE; CALIBRATION; LIGHT SCATTERING; NANOMETER DIFFERENTIAL MOBILITY ANALYZER; PRIORITY JOURNAL; REFERENCE VALUE; VISCOSITY;

EID: 84860534287     PISSN: 00218502     EISSN: 18791964     Source Type: Journal    
DOI: 10.1016/j.jaerosci.2012.04.005     Document Type: Article

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