Electrical and electron paramagnetic resonance spectroscopy characterization of Mn-doped nanostructured TiO 2 for capacitor applications

Journal of Power Sources

Volumn 210, Issue , 2012, Pages 21-25

  Vazquez Reina, Rafael ^a   Chao, Sheng ^b   Petrovsky, Vladimir ^b   Dogan, Fatih ^b   Greenbaum, Steven ^a  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b University of Missouri Rolla   (United States)

Author keywords

Capacitors; Electron paramagnetic resonance (EPR); Insulation resistance; Nanostructured TiO 2

Indexed keywords

DIELECTRIC BREAKDOWN STRENGTH; DOPANT IONS; ELECTRICAL MEASUREMENT; ELECTRON PARAMAGNETIC RESONANCE SPECTROSCOPY; GRAIN BOUNDARY RESISTIVITY; HIGH ENERGY DENSITIES; HIGHER ENERGY DENSITY; INSULATION RESISTANCE; MN-DOPED; MN-DOPING; NANOSTRUCTURED TIO; NON-UNIFORM DISTRIBUTION; TIO;

CAPACITORS; CERAMIC CAPACITORS; DIELECTRIC LOSSES; DIELECTRIC MATERIALS; DOPING (ADDITIVES); ELECTRIC BREAKDOWN; ELECTRIC PROPERTIES; ELECTRON RESONANCE; ELECTRON SPIN RESONANCE SPECTROSCOPY; GRAIN BOUNDARIES; INSULATION; LEAKAGE CURRENTS; MANGANESE; METAL IONS; PARAMAGNETIC RESONANCE; PARAMAGNETISM; SCANNING ELECTRON MICROSCOPY; SINTERING;

TITANIUM DIOXIDE;

EID: 84860499042     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2012.02.096     Document Type: Article

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