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Volumn 84, Issue 9, 2012, Pages 4179-4184

Elemental determination of microsamples by liquid film dielectric barrier discharge atomic emission spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATING CURRENT; ANALYTE CONCENTRATION; ATOMIC EMISSION; ATOMIC EMISSION SPECTROMETRY; COPPER ELECTRODES; DETECTION LIMITS; DIELECTRIC BARRIER; DIELECTRIC BARRIER DISCHARGES; FILM SURFACES; FLOW SYSTEMS; GLASS SLIDES; HIGH VOLTAGE; HIGH-THROUGHPUT ANALYSIS; IN-FIELD; LIQUID DISCHARGE; LOW POWER SUPPLY; MICRO-ANALYSIS SYSTEMS; MICROSAMPLES; PEAK VOLTAGE; PERISTALTIC PUMP; QUANTITATIVE DETERMINATIONS; RELATIVE STANDARD DEVIATIONS; SAMPLE SOLUTION; SAMPLE VOLUME; THIN LIQUID FILM; TUNGSTEN WIRES;

EID: 84860494502     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac300518y     Document Type: Article
Times cited : (67)

References (40)
  • 40
    • 84860452147 scopus 로고    scopus 로고
    • (accessed March 27, 2012).
    • http://microem.co.jp/products/pdf/MH-5000-measurement-range.pdf (accessed March 27, 2012).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.