Elemental determination of microsamples by liquid film dielectric barrier discharge atomic emission spectrometry

Analytical Chemistry

Volumn 84, Issue 9, 2012, Pages 4179-4184

  He, Qian ^a   Zhu, Zhenli ^a   Hu, Shenghong ^a   Zheng, Hongtao ^a   Jin, Lanlan ^a  

^a CHINA UNIVERSITY OF GEOSCIENCES   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATING CURRENT; ANALYTE CONCENTRATION; ATOMIC EMISSION; ATOMIC EMISSION SPECTROMETRY; COPPER ELECTRODES; DETECTION LIMITS; DIELECTRIC BARRIER; DIELECTRIC BARRIER DISCHARGES; FILM SURFACES; FLOW SYSTEMS; GLASS SLIDES; HIGH VOLTAGE; HIGH-THROUGHPUT ANALYSIS; IN-FIELD; LIQUID DISCHARGE; LOW POWER SUPPLY; MICRO-ANALYSIS SYSTEMS; MICROSAMPLES; PEAK VOLTAGE; PERISTALTIC PUMP; QUANTITATIVE DETERMINATIONS; RELATIVE STANDARD DEVIATIONS; SAMPLE SOLUTION; SAMPLE VOLUME; THIN LIQUID FILM; TUNGSTEN WIRES;

ATMOSPHERIC PRESSURE; COPPER; DIELECTRIC DEVICES; ELECTRODES; FLOW CONTROL; GLASS; INERT GASES; LIQUID FILMS; METAL IONS; NITRIC ACID; SODIUM; TUNGSTEN; WIRE; ZINC;

ELECTRIC DISCHARGES;

EID: 84860494502     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac300518y     Document Type: Article

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