Silicon nanopillars for field-enhanced surface spectroscopy

ACS Nano

Volumn 6, Issue 4, 2012, Pages 2948-2959

  Wells, Sabrina M ^a   Merkulov, Igor A ^b   Kravchenko, Ivan I ^b   Lavrik, Nickolay V ^b   Sepaniak, Michael J ^a  

^a UNIVERSITY OF TENNESSEE   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

axial illumination; FDTD analysis; fundamental HE11 mode; large local field enhancement; SEF; SERS; silicon nanopillars

Indexed keywords

FDTD ANALYSIS; HE11 MODES; LOCAL FIELD ENHANCEMENT; NANOPILLARS; SEF; SERS;

FINITE DIFFERENCE TIME DOMAIN METHOD; FLUORESCENCE; FLUORESCENCE MICROSCOPY; NANOPHOTONICS; NANOWIRES; OPTICAL PROPERTIES; PLASMONS; SUBSTRATES; TIME DOMAIN ANALYSIS;

REACTIVE ION ETCHING;

NANOMATERIAL; SILICON;

ARTICLE; CHEMISTRY; METHODOLOGY; NANOTECHNOLOGY; RAMAN SPECTROMETRY; SPECTROFLUOROMETRY; SURFACE PROPERTY;

NANOSTRUCTURES; NANOTECHNOLOGY; SILICON; SPECTROMETRY, FLUORESCENCE; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES;

EID: 84860381340     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn204110z     Document Type: Article

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