Towards a quantitative analysis of magnetic force microscopy data matrices

Journal of Magnetism and Magnetic Materials

Volumn 324, Issue 16, 2012, Pages 2416-2428

  Chiolerio, A ^a,b   Allia, P ^a  

^a POLITECNICO DI TORINO   (Italy)

^b ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

Author keywords

2 Dimensional entropy; Atomic force microscopy; Ferromagnetic thin film; Magnetic domain; Magnetic force microscopy; Texture Analysis

Indexed keywords

ABSOLUTE PERFORMANCE; ANGULAR DEPENDENCE; APPLIED MAGNETIC FIELDS; DATA MATRICES; DATA REPRESENTATIONS; DATA SETS; ENTROPIC ANALYSIS; FEATURE EXTRACTION AND CLASSIFICATION; FERROMAGNETIC THIN FILMS; IMAGING TOOLS; MAGNETIC TEXTURES; MEASURING INSTRUMENTS; MICROSCOPY IMAGES; PATTERNED MAGNETIC MATERIAL; SCANNING PROBES; STABILITY DIAGRAM; STRAY MAGNETIC FIELDS; TEXTURE ANALYSIS; TEXTURE MAPPING;

ATOMIC FORCE MICROSCOPY; FEATURE EXTRACTION; FERROMAGNETIC MATERIALS; FERROMAGNETISM; MAGNETIC DOMAINS; MAGNETIC FIELDS; MAGNETIC FORCE MICROSCOPY; MAGNETIC THIN FILMS; OPTICAL DATA PROCESSING; TEXTURES;

IMAGE TEXTURE;

EID: 84860295647     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2012.01.035     Document Type: Article

References (20)

1. C.T. Yu, H. Jiang, L. Shen, P.J. Flanders, and G.J. Mankey Journal of Applied Physics 87 2002 6322
2. S.P. Li, D. Peyrade, M. Natali, A. Lebib, Y. Chen, U. Ebels, L.D. Buda, and K. Ounadjela Physical Review Letters 86 2001 1102
3. S.H. Liou, R.F. Sabiryanov, S.S. Jaswal, J.C. Wu, and Y.D. Yao Journal of Magnetism and Magnetic Materials 226-230 2001 1270
4. S. Porthun, L. Abelmann, and C. Lodder Journal of Magnetism and Magnetic Materials 182 1998 238
5. T. Chang, M. Lagerquist, J.-G. Zhu, and J.H. Judy IEEE Transactions on Magnetics 28 1992 3138 3140
6. H.J. Hug, B. Stiefel, P.J.A. van Schendel, A. Moser, R. Hofer, S. Martin, H.-J. Guntherodt, S. Porthun, L. Abelmann, J.C. Lodder, G. Bochi, and R.C. OHandley Journal of Applied Physics 83 1998 5609
7. S.L. Tomlinson, and E.W. Hill Journal of Magnetism and Magnetic Materials 161 1996 385
8. F.M. Candocia, E.B. Svedberg, D. Litvinov, and S. Khizroev Nanotechnology 15 2004 S575
9. M.R. Koblischka, U. Hartmann, and T. Sulzbach Materials Science and Engineering C 23 2003 747 751
10. J.M. Garcìa-Martìn, A. Thiaville, J. Miltat, T. Okuno, L. Vila, and L. Piraux Journal of Physics D: Applied Physics 37 2004 965 972
11. M. Bode, M. Dreyer, M. Getzlaff, M. Kleiber, A. Wadas, and R. Wiesendanger Journal of Physics: Condensed Matter 11 1999 9387 9402
12. R.M. Haralick, K. Shanmugam, and I. Dinstein IEEE Transactions on Systems, Man, and Cybernetics, SMC 3 1973 610
13. R.M. Haralick Proceedings of the IEEE 67 1979 786
14. A. Chiolerio, E. Celasco, F. Celegato, S. Guastella, P. Martino, P. Allia, P. Tiberto, and F. Pirri Journal of Magnetism and Magnetic Materials 320 2008 e669
15. A. Chiolerio, P. Allia, E. Celasco, P. Martino, F. Spizzo, and F. Celegato Journal of Magnetism and Magnetic Materials 322 2010 1409
16. A. Chiolerio, P. Martino, M. Coisson, and P. Allia Journal of Magnetism and Magnetic Materials 321 2009 3099
17. R.D. Gomez, E.R. Burke, and I.D. Mayergoyz Journal of Applied Physics 79 1996 6441 6446
18. A. Chiolerio, Physica B: Condensed Matter, doi:10.1016/j.physb.2011.09. 054, in press.
19. C.H. Chen, L.F. Pau, and P.S.P. Wang The Handbook of Pattern Recognition and Computer Vision 1998 World Scientific Publishing Co. (pp. 207-248)
20. Y. Hu, C.-X. Zhao, and H.-N. Wang IEEE Pacific-Asia Workshop on Computational Intelligence and Industrial Application 2008 277