Deconvolution processing for increasing the resolution of magnetic force microscopy measurements

Nanotechnology

Volumn 15, Issue 10, 2004, Pages

  Candocia, Frank M ^a   Svedberg, Erik B ^b   Litvinov, Dmitri ^c   Khizroev, Sakhrat ^a  

^a The Department of Electrical and Computer Engineering   (United States)

^b SEAGATE TECHNOLOGY   (United States)

^c UNIVERSITY OF HOUSTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; ION BEAMS; MAGNETIC FIELD EFFECTS; MAGNETIZATION; MAGNETOSTATICS; MICROSCOPIC EXAMINATION; NANOTECHNOLOGY; OPTICAL RESOLVING POWER; RAPID PROTOTYPING; THIN FILMS;

DECONVOLUTION; FOCUSED ION BEAMS; MAGNETIC FORCE MICROSCOPY (MFM); SCANNING PROBE MICROSCOPY (SPM);

MAGNETIC RESONANCE IMAGING;

EID: 7044274705     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/10/014     Document Type: Conference Paper

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