Evolution of PD patterns in polyethylene insulation cavities under AC voltage

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 19, Issue 2, 2012, Pages 533-542

  Wang, Le ^a   Cavallini, Andrea ^a   Montanari, Gian Carlo ^a   Testa, Luigi ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b Techimp Services Srl   (Italy)

Author keywords

damage growth rate; gas pressure; Partial discharges; PD ageing; PD time behavior; phase resolved PD patterns; polyethylene; polymeric materials

Indexed keywords

AC VOLTAGE; AGEING TESTS; AGING PROCESS; ARTIFICIAL CAVITY; DAMAGE GROWTH; GAS PRESSURES; GAS VOLUME; INDUCED DAMAGE; LIFE MODELS; PD MEASUREMENTS; PD PARAMETERS; PD PATTERN; POLYETHYLENE INSULATION; REPETITION RATE; TIME BEHAVIOR;

DEFECTS; GASES; PARTIAL DISCHARGES; POLYETHYLENES; POLYMERS; TESTING; THERMOPLASTICS;

PHASE INTERFACES;

EID: 84860191740     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2012.6180247     Document Type: Article

References (27)

1. G. Mazzanti, G.C. Montanari and L. Dissado, "Electrical aging and life models: The role of space charge", IEEE Trans. Dielectr. Electr. Insul., Vol. 12, pp. 876-890, 2005.
2. R.J. Van Brunt, "Physics and chemistry of partial discharge and corona", IEEE Trans. Dielectr. Electr. Insul., Vol.1, pp. 761-784, 1994.
3. T. Tanaka, "Internal partial discharge and material degradation", IEEE Trans. Dielectr. Electr. Insul., Vol. 21, pp. 899-905, 1986.
4. P.H.F. Morshuis, Parital Discharge Mechanisns, Ph.D. degree thesis, Delft University of Technology, ISBN 90-6275-931-9, 1993.
5. G.C. Montanari, "Bring an insulation to failure: The role of space charge", IEEE Trans. Dielectr. Electr. Insul., Vol. 18, pp. 339-364, 2011.
6. K. Temmen, "Evaluation of surface changes in flat cavities due to ageing by means of phase-angle resolved partial discharge measurement", J. Phys. D: Appl. Phys., Vol. 33, pp. 603-608, 2000.
7. Yasuo Sekii and Kazuki Yamauchi, "Analysis of deterioration by partial discharge of XLPE using GCMS and FTIR", Int'l. Conf. Condition Monitoring and Diagnosis (ICCMD), Beijing, China, pp. 251-254, 2008.
8. Y. Sekii, H. Oguma, T. Hagiwara and K. Yamauchi "GC-MS and FTIR analysis of LDPE and XLPE deteriorated by partial discharge" IEEE Int'l. Conf. Electr. Insul. Dielectr. Phenomenon (CEIDP), pp. 237-240, Nashville, USA, 2005.
9. Y. Sekii, T. Fukuyama and K. Kikuchi, "Deterioration by partial discharges of polyethylene in oxygen containing gas atmosphere," IEEE Int'l. Conf. Properties and Applications of Dielectric Materials (ICPADM), Xi'an, China, pp. 479-482, 2000.
10. Y. Suzuoki, Y. Kodani, F. Komori, and T. Kato, "Relation between concentration of partial discharge and surface degradation and breakdown", IEEE Conf. Electr. Insul. Dielectr. Phenomenon (CEIDP), Quebec, Canada, pp. 404-407, 2008.
11. G. Mazzanti, G. C. Montanari and F. Civenni, "Model of inception and growth of damage from Microcavities in polyethylene-based materials for HVDC cables Part 1: Theoretical approach", IEEE Trans. Dielectr. Electr. Insul., Vol. 14, pp. 1242-1254, 2007.
12. G. Mazzanti, G. C. Montanari and F. Civenni, "Model of inception and growth of damage from Microcavities in polyethylene-based materials for HVDC cables Part 2: Parametric investigation and data fitting", IEEE Trans. Dielectr. Electr. Insul., Vol. 14, pp. 1255-1263, 2007.
13. S. Serra, G.C. Montanari and G. Mazzanti, "Theory of inception mechanism and growth of defect-induced damage in polyethylene cable insulation", J. Appl. Phys., Vol. 98, pp. 034102.1-034102.15, 2005.
14. G. C. Montanari, A. Cavallini, L. Testa and S. Serra, "Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage", IEEE Conf. Electr. Insul. Dielectr. Phenomenon (CEIDP), Quebec, Canada, pp. 29-32, 2008.
15. L. Testa, Physical Model of Damage Inception and Growth in Polymeric Insulating Materials Subjected to Partial Discharges under DC and AC Voltage", Ph.D. degree thesis, University of Palermo, 2009.
16. A. Cavallini, F. Ciani, G. Mazzanti and G. C. Montanari, "Firs electron availability and partial discharge generation in insulation cavities: Effect of light irradiation", IEEE Trans. Dielectr. Electr. Insul., Vol. 12, pp. 387-394, 2005.
17. G.C. Montanari, G.Mazzanti, and L. Simoni, "Progress in electrothemal life modeling of electrical insulation over the last decades", IEEE Trans. Dielectr. Electr. Insul., Vol. 9, pp. 730-745, 2002.
18. S.A. Boggs, "Theory of defect-tolerant dielectric systems", IEEE Trans. Electr. Insul, Vol. 28, pp. 365-371, 1993.
19. L. Sanche, "Nanoscopic aspects of electronic aging in dielectrics", IEEE Trans. Dielectr. Electr. Insul., Vol. 4, pp. 507-543, 1997.
20. L. Wang, L. Testa, A. Cavallini and G. C. Montanari, "Relation between the Trend of Partial Discharges and Aging Models under AC Voltage", IEEE Int'l. Conf. Properties and Applications of Dielectr. Materials (ICPADM), Harbin, China, pp. 268-271, 2009.
21. L. Wang, A. Cavallini and G. C. Montanari, "Patterns of partial discharge activity in XLPE: From inception to breakdown", IEEE Int'l. Conf. Solid Dielectrics (ICSD), Potsdam, Germany, pp. 553-556, 2010.
22. F. Gutfleisch and L. Niemeyer, "Measurement and Simulation of PD in Epoxy Cavities", IEEE Trans. Dielectr. Electr. Insul., Vol. 2, pp. 729-743, 1995.
23. A.C. Gjaerde, "Measurement of void gas pressure during combined thermal and partial discharge ageing of epoxy", IEE Proc. Sci., Measur. Techn., Vol. 142, pp. 17-21, 1995.
24. A.C. Gjaerde and J. Sletbak, "Influence of partial discharges on void gas pressure", Int'l. Conf. Partial Discharge (ICPD), Canterbury, UK, pp.119-120, 2002.
25. C.-S. Kim, T. Kondo and T. Mizutani, "Change in PD pattern with ageing", IEEE Trans. Dielectr. Electr. Insul., Vol.11, pp.13-18, 2004.
26. P. H. F.Morshuis, "Degradation of solid dielectrics due to internal partial discharge: Some thoughts on progress made and where to go now", IEEE Trans. Dielectr. Electr. Insul., Vol.12, pp. 905-913, 2005.
27. M. Hikita, K. Yamada, A. Nakamura, T. Mizutani, A. Oohasi, and M. Ieda, "Measurement of partial discharges by computer and analysis of partial discharge distribution by the Monte Carlo Method", IEEE Trans. Dielectr. Electr. Insul., Vol. 25, pp.453-48, 1995.