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Volumn , Issue , 2010, Pages

Patterns of partial discharge activity in XLPE: From inception to breakdown

Author keywords

Life models; Partial discharges

Indexed keywords

ARTIFICIAL DEFECTS; CRITICAL LEVEL; LIFE MODELS; PARTIAL DISCHARGE ACTIVITY; PD INCEPTION VOLTAGE; REPETITION RATE; SANDWICH TEST;

EID: 77958044502     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSD.2010.5568121     Document Type: Conference Paper
Times cited : (14)

References (9)
  • 1
    • 28744434409 scopus 로고    scopus 로고
    • Electrical aging and life models: The role of space charge
    • October
    • G. Mazzanti, G.C. Montanari and L. Dissado, "Electrical aging and life models: the role of space charge", IEEE Trans. Dielectr. Electr. Insul., Vol. 12, NO.5, October, pp. 876-890, 2005.
    • (2005) IEEE Trans. Dielectr. Electr. Insul. , vol.12 , Issue.5 , pp. 876-890
    • Mazzanti, G.1    Montanari, G.C.2    Dissado, L.3
  • 2
    • 23944476125 scopus 로고    scopus 로고
    • Theory of inception mechanism and growth of defect-induced damage in polyethylene cable insulation
    • S. Serra, G.C. Montanari and G. Mazzanti, "Theory of inception mechanism and growth of defect-induced damage in polyethylene cable insulation", J. Appl. Phys., Vol. 98, pp. 034102.1-034102.15, 2005
    • (2005) J. Appl. Phys. , vol.98
    • Serra, S.1    Montanari, G.C.2    Mazzanti, G.3
  • 5
    • 0029388077 scopus 로고
    • Measurement and Simulation of PD in Epoxy Voids
    • October
    • F. Gutfleisch and L. Niemeyer, "Measurement and Simulation of PD in Epoxy Voids", IEEE Trans. Dielectr. Electr. Insul., Vol. 2, NO.5, October, pp. 729-743, 1995.
    • (1995) IEEE Trans. Dielectr. Electr. Insul. , vol.2 , Issue.5 , pp. 729-743
    • Gutfleisch, F.1    Niemeyer, L.2
  • 6
    • 35348861544 scopus 로고    scopus 로고
    • Model of inception and growth of damage from Microvoids in polyethylene-based materials for HVDC cables Part 1: Theoretical approach
    • October
    • G. Mazzanti, G.C. Montanari and F. Civenni, "Model of inception and growth of damage from Microvoids in polyethylene-based materials for HVDC cables Part 1: Theoretical approach", IEEE Trans. Dielectr. Electr. Insul., Vol. 14, NO.5, October, pp. 1242-1254, 2007.
    • (2007) IEEE Trans. Dielectr. Electr. Insul. , vol.14 , Issue.5 , pp. 1242-1254
    • Mazzanti, G.1    Montanari, G.C.2    Civenni, F.3
  • 7
    • 35348825738 scopus 로고    scopus 로고
    • Model of inception and growth of damage from Microvoids in polyethylene-based materials for HVDC cables Part 2: Parametric Investigation and Data Fitting
    • October
    • G. Mazzanti, G.C. Montanari and F. Civenni, "Model of inception and growth of damage from Microvoids in polyethylene-based materials for HVDC cables Part 2: Parametric Investigation and Data Fitting", IEEE Trans. Dielectr. Electr. Insul., Vol. 14, NO.5, October, pp. 1255-1263, 2007.
    • (2007) IEEE Trans. Dielectr. Electr. Insul. , vol.14 , Issue.5 , pp. 1255-1263
    • Mazzanti, G.1    Montanari, G.C.2    Civenni, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.