Micrometre resolution of a charge integrating microstrip detector with single photon sensitivity

Journal of Synchrotron Radiation

Volumn 19, Issue 3, 2012, Pages 359-365

  Schubert, A ^a   Bergamaschi, A ^b   David, C ^b   Dinapoli, R ^b   Elbracht Leong, S ^a   Gorelick, S ^b   Graafsma, H ^c   Henrich, B ^b   Johnson, I ^b   Lohmann, M ^c   Mozzanica, A ^b   Radicci, V ^b   Rassool, R ^a   Schadler L ^b   Schmitt, B ^b   Shi, X ^b   Sobott, B ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

^c DESY   (Germany)

Author keywords

charge integrating; strip detectors; synchrotron radiation instrumentation

Indexed keywords

CHARGE INTEGRATING; INTERPOLATION METHOD; MICRO-STRIP DETECTORS; SILICON STRIP SENSOR; SINGLE PHOTON SENSITIVITY; SPATIAL RESOLUTION; STRIP DETECTORS; SYNCHROTRON BEAMS; SYNCHROTRON RADIATION INSTRUMENTATION;

IMAGE RESOLUTION;

PARTICLE BEAMS;

EID: 84860172881     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S090904951200235X     Document Type: Article

References (13)

1. Agostinelli, S. et al. (2003). Nucl. Instrum. Methods Phys. Res. A, 506, 250-303.
2. Bergamaschi, A., Broennimann, C., Dinapoli, R., Eikenberry, E., Gozzo, F., Henrich, Kobas, M., Kraft, P., Patterson, B. & Schmitt, B. (2008). Nucl. Instrum. Methods Phys. Res. A, 591, 163-166.
3. Bergamaschi, A., Dinapoli, R., Henrich, B., Johnson, I., Mozzanica, A., Shi, X. & Schmitt, B. (2011). Nucl. Instrum. Methods Phys. Res. A, 628, 238-241.
4. Brenner, R., Harr, R., Rudge, A., Santos, D., Straver, J.,Weilhammer, P., Czermak, A., Gadomski, S., Turala, M., Bonvicini, V., Kucewicz, W., Masiocchi, S., Vegni, G. & Voutilainen, M. (1993). Nucl. Instrum. Methods Phys. Res. A, 326, 189-197.
5. Hubbeling, L., Turala, M., Weilhammer, P., Brenner, R., Hietanen, I. & Lindgren, J. (1991). Nucl. Instrum. Methods Phys. Res. A, 310, 197-202.
6. Johnson, I., Amsler, C., Chiochia, V., Dorokhov, A., Pruys, H., Regenfus, C. & Rochet, J. (2004). Nucl. Instrum. Methods Phys. Res. A, 540, 113-120.
7. Lutz, G. (1999). Semiconductor Radiation Detectors. Berlin: Springer.
8. Mozzanica, A., Bergamaschi, A., Dinapoli, R., Graafsma, H., Henrich, B., Kraft, P., Johnson, I., Lohmann, M., Schmitt, B. & Shi, X. (2009). Proceedings of the 11th European Symposium on Semiconductor Detectors, 7-11 June 2009,
9. Wilbad Kreuth, Germany. Mozzanica, A., Bergamaschi, A., Dinapoli, R., Graafsma, H., Henrich, B., Kraft, P., Johnson, I., Lohmann, M., Schmitt, B. & Shi, X. (2010). Nucl. Instrum. Methods Phys. Res. A, 633, S29-S32.
10. Schubert, A., O'Keefe, G. J., Sobott, B. A., Kirby, N. M. & Rassool, R. P. (2010). Radiat. Phys. Chem. 79, 1111-1114.
11. Straulino, S., Adriani, O., Bonechi, L., Bongi,M., Bottai, S., Castellini, G., Fedele, D., Grandi, M., Papini, P., Ricciarini, S. B., Spillantini, P., Taccetti, F., Taddei, E. & Vannuccini, E. (2006). Nucl. Instrum. Methods Phys. Res. A, 556, 100-114.
12. Turchetta, R. (1993). Nucl. Instrum. Methods Phys. Res. A, 335, 44-58.
13. Gorelick, S., Guzenko, V. A., Vila-Comamala, J. & David, C. (2010). Nanotechnology, 21, 295-303.