Reconstruction and electronic properties of silicon nanosheets as a function of thickness

Nanoscale

Volumn 4, Issue 9, 2012, Pages 2906-2913

  Spencer, Michelle J S ^a,b   Morishita, Tetsuya ^a,c   Snook, Ian K ^a  

^a RMIT UNIVERSITY   (Australia)

^b LA TROBE UNIVERSITY   (Australia)

^c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHAIN STRUCTURE; DENSITY FUNCTIONAL THEORY CALCULATIONS; ELECTRONIC DEVICE; RELATIVE ORIENTATION; SI (1 1 1); SURFACE LAYERS;

DENSITY FUNCTIONAL THEORY; NANOSHEETS; SILICON; SURFACES;

ELECTRONIC PROPERTIES;

EID: 84859872657     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c2nr30100h     Document Type: Article

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