Characterization of cerium oxide nanoparticles-Part 2: Nonsize measurements

Environmental Toxicology and Chemistry

Volumn 31, Issue 5, 2012, Pages 994-1003

  Baalousha, Mohammed ^a   Ju Nam, Yon ^a   Cole, Paula A ^a   Hriljac, Joseph A ^a   Jones, Ian P ^a   Tyler, Charles R ^b   Stone, Vicki ^c   Fernandes, Teresa F ^c   Jepson, Mark A ^d   Lead, Jamie R ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^b UNIVERSITY OF EXETER   (United Kingdom)

^c HERIOT WATT UNIVERSITY   (United Kingdom)

^d UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

Cerium oxide; Chemical composition; Crystal structure; Manufactured nanomaterials; Microscopy; Surface properties

Indexed keywords

AQUEOUS MEDIA; CERIUM OXIDE NANOPARTICLE; CERIUM OXIDES; CHEMICAL COMPOSITIONS; ELECTRON ENERGY LOSS; ELECTRON MICROSCOPY , SCANNING; ISO-ELECTRIC POINTS; MANUFACTURED NANOMATERIALS; MICROMETER PARTICLE; MULTI-METHOD APPROACH; PHYSICOCHEMICAL PROPERTY; X-RAY PHOTOELECTRONS;

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTROPHORESIS; ENERGY DISPERSIVE SPECTROSCOPY; GEOMETRY; MICROSCOPIC EXAMINATION; NANOPARTICLES; NANOSTRUCTURED MATERIALS; PHOTOELECTRONS; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; TOXICITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDES;

CERIUM OXIDE; NANOPARTICLE;

AGGREGATION; CERIUM; CHEMICAL COMPOSITION; CRYSTAL STRUCTURE; MICROSCOPY; NANOTECHNOLOGY; PARTICLE SIZE; PH; PHYSICOCHEMICAL PROPERTY;

AQUEOUS SOLUTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; CRYSTAL; CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTROPHORESIS; INTERMETHOD COMPARISON; MORPHOLOGY; PARTICLE SIZE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

CATIONS; CERIUM; ISOELECTRIC POINT; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, ELECTRON, TRANSMISSION; NANOPARTICLES; SPECTRUM ANALYSIS; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 84859837064     PISSN: 07307268     EISSN: 15528618     Source Type: Journal    
DOI: 10.1002/etc.1786     Document Type: Article

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